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Cryogenic Probe Stations

Cryogenic Probe Stations

Unique Wafer-Level Probing down to 4 K
Features and Benefits:
  • Test your devices at temperatures from 4 to 400 K
  • Probing is as simple as on standard wafer-level probers
  • Easy and ergonomic wafer handling with special substrate carriers
  • Full range of accessories for a complete cryogenic testing solution
  • Manual and semiautomatic versions available
TCE Model # Impedance Configuration dB Total dB Step Frequency Start Frequency Stop Control Downloads Product Enquiry
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