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Cryogenic Probe Stations
Cryogenic Probe Stations
Cryogenic Probe Stations
Unique Wafer-Level Probing down to 4 K
Features and Benefits:
Test your devices at temperatures from 4 to 400 K
Probing is as simple as on standard wafer-level probers
Easy and ergonomic wafer handling with special substrate carriers
Full range of accessories for a complete cryogenic testing solution
Manual and semiautomatic versions available
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Impedance
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dB Total
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