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Probe Cards

Probe Cards

Pyramid Probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Its industry-leading signal integrity and mechanical alignment capabilities make these probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SoCs, and leading edge DC and RF parametric testing.
TCE Model # Impedance Configuration dB Total dB Step Frequency Start Frequency Stop Control Downloads Product Enquiry
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